Scanning electron microscopy with polarization analysis for multilayered chiral spin textures
نویسندگان
چکیده
منابع مشابه
Scanning Electron Microscopy with Polarization Analysis (sempa) and Its Applications
Scanning Electron Microscopy with Polarization Analysis (SEMPA) is a technique for directly imaging the magnetic microstructure of surfaces and thin films. SEMPA relies on the fact that secondary electrons emitted from a magnetic sample in a Scanning Electron Microscope (SEM) have a spin polarization which reflects the net spin density in the material. This spin density, in turn, is directly re...
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ژورنال
عنوان ژورنال: Applied Physics Letters
سال: 2017
ISSN: 0003-6951,1077-3118
DOI: 10.1063/1.4998535